01/3910
Ametek Splinter Shields

Ametek Splinter Shields for use with materials testing machines are available to protect the user when testing brittle samples which are liable to fragment. The shields help prevent sample splinters from leaving the test area when performing a test. Shields for dual column test stands (both bench and floor) are fully hinged and can be easily opened, allowing full access to the test area from the front or back of the machine. The machine automatically detects whether the doors are open or closed, ensuring the shield is always securely closed before it will perform. These Ametek splinter shields are available in two main types:
  • Sliding splinter shields move in the vertical axis of the machine column and can be easily lowered to safely enclose the test area once the sample is positioned.
  • Hinged splinter shields are available in a range of sizes and can be fitted to enclose either the test area or the entire machine
These shields are simple to set up and operate. They are available in a range of sizes and specifications.

Model:01/3910
Description:LS - Interlocked Splinter Shield 1400mm Travel

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Models for this Product:
01/3161,  01/3909,  01/3910,  07/2058F,  01/3064,  01/3095,  01/3142

Manufacturer:
Ametek / Chatillon

Types:
Splinter Shields,

Industries:
Aerospace & Aviation, Chemical & Petrochemical, Laboratory & R&D, Medical & Pharmaceutical, Plastics & Polymers

Applications:
Adhesion Testing, Bending Flexural Testing, Bond Strength Testing, Break Strength Testing, Compression Testing, Creep Testing, Crush Resistance Testing, Deformation Testing, Delamination Strength Testing, Ductility Testing, Durability Testing, Elastic Limit Testing, Elongation Testing, Flexural Strength Testing, International Standards – Adhesives and Sealants, Modulus of Elasticity Testing, Puncture Testing, Quality Control Testing, Research & Development Testing, Rupture Testing, Shear Strength Testing, Stress Relaxation Testing, Tear Resistance Testing, Tear Strength Testing, Tensile Testing, Tension Testing, Toughness Testing, Young’s Modulus Testing